Compact Industrial I/O Modules with PROFINET S2 Redundancy, IO-Link, and IP69K Protection

Industrial I/O Solutions Aligned with Modern Automation Standards

From machine builders and system integrators to end-users in process and discrete manufacturing, one demand unites them all: the need for flexible, reliable, and future-ready I/O solutions. Today’s industrial systems must be modular, highly available, and installation-friendly, while supporting digitalization down to the sensor level.

No matter the application — packaging, filling, mobile systems, or harsh production zones — the expectations are clear:

Fast field device integration
Reduced wiring and cabinet space
System redundancy for zero downtime
Smarter diagnostics and remote access
Multiprotocol flexibility for global compatibility

Turck TBEN Series: Engineered for Real-World Performance

Turck’s TBEN I/O modules address these exact needs, offering a field-level automation platform that delivers:

✅ Zero-Downtime System Redundancy

With PROFINET S2 redundancy, modules can communicate with both primary and backup PLCs. Critical systems remain operational even during controller failures.

✅ IO-Link Integration for Smarter Connectivity

Embedded IO-Link master ports (Class A and B) allow plug-and-play sensor integration, parameterization, and diagnostics. With SIDI, IO-Link devices are natively visible in TIA Portal.

✅ Industrial-Grade Reliability

Shock-tested, temperature-rated (-40…+70 °C), and certified for ATEX Zone 2/22, TBEN modules are suited for food & beverage, chemical processing, mobile automation, and more.

✅ Modular, Decentralized Installation

Mount directly on machines – no cabinet required. IP69K protection and fully potted electronics ensure operation in washdown zones, outdoor systems, and mobile equipment.

✅ Protocol Flexibility Built In

Each module supports PROFINET (with S2), EtherNet/IP, Modbus TCP, and CC-Link IE Field Basic. Integrated Ethernet switch ports with auto protocol detection streamline commissioning and reduce inventory complexity.